Non-destructive characterization of ultra-thin films (Recorded Webinar)

New and emerging technologies rely on the engineering of the near-surface region of a solid surface. For this type of material, including self-assembled monolayers, surface modified polymers and semiconductor devices, it is essential that the composition of the first few nanometers is known with confidence.

The Thermo Scientific™ Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer System provides this information using parallel angle resolved XPS (PARXPS) and the advanced software of the Avantage data system, which produces accurate and precise answers.

Discover how collect angle-resolved spectra without the need to tilt the sample to nondestructively characterize ultra-thin layers.

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