Join our free seminar at EMC 2012
Full Chemical Characterization for Surfaces and Microstructures with XPS and Microanalysis

Join our free lunchtime seminar during EMC 2012:

12:30-13:15 Tuesday 18th September
12:30-13:15 Thursday 20th September

These seminars will outline several analysis examples to demonstrate the power of using a multi-technique approach for complete chemical characterisaton. XPS is used for surface characterisation and EDS, WDS and EBSD for near surface (5 micron depth) compositional and structural analysis.

The seminar also provides an opportunity to interact with our technical experts who will also be available throughout the conference on Booth 305 in the exhibition area. A FREE lunch-bag will be provided to all attendees. Only 25 places per seminar so register now for you and your colleagues!

To register please complete your details below.

Plan your time at EMC - Book a demo!
Plan ahead and book a personal demonstration of our instruments at EMC:
Thermo Scientific NORAN System 7 system
Thermo Scientific Ultradry EDS X-ray Detector
Thermo Scientific WDS MagnaRay Spectrometer
Thermo Scientific QuasOr EBSD Camera

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Join our free seminar at EMC 2012Full Chemical Characterization for Surfaces and Microstructures with XPS and Microanalysis

* Fields marked with an asterisk must be completed.

Which of the following techniques do you currently use?

Join our free seminar at EMC 2012
Full Chemical Characterization for Surfaces and Microstructures with XPS and Microanalysis