Characterization of Microcrystalline Silicon with Raman

Free On Demand Presentation

This webinar introduces the capabilities of Raman spectroscopy for the characterization of microcrystalline silicon. It covers the determination of amorphous and crystalline silicon. And includes a in depth discussion of the background on how Raman measurements work, and the benefits Raman offers to the characterization of your silicon samples.

Examples include the analysis of small features and the confocal analysis of coated samples.

By the end of this webinar you will be familiar with the ways in which Raman can add powerful analysis capabilities to your laboratory for characterizing microcrystalline silicon.

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