Our AFM-Raman system delivers essential topographical and other surface information along with chemical and morphological characterization to provide deep understanding of materials. The combination of the NT-MDT™ Ntegra™ AFM and the Thermo Scientific™ DXR™ Raman microscope is a highly integrated flexible, and optimized characterization system that maximizes understanding at the nanoscale level. Through co-localized AFM-Raman and tip-enhanced Raman spectroscopy (TERS) measurements, researchers can achieve new insights about materials quickly and confidently.
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